OEApplications 2023.2

Getting Started
AFITT 2.6.4.3
BROOD 3.2.2.3
EON 2.4.2.3
- Introduction
  - Overview
  - Applications
- EON
- Theory
- Release History
  - EON 2.4.2
  - Zap TK 2.4.6
  - EON 2.4.1
  - Zap TK 2.4.5
  - EON 2.4.0
  - Zap TK 2.4.4
  - EON 2.3.7
  - Zap TK 2.4.3
  - EON 2.3.6
  - Zap TK 2.4.2
  - EON 2.3.5
  - Zap TK 2.4.1
  - EON 2.3.4.0
  - Zap TK 2.4.0
  - EON 2.3.3
  - EON 2.3.2
  - EON 2.3.1
  - EON 2.3.0
  - EON 2.2.0
  - EON 2.1.0
  - EON 2.0.0
- Citation
OEDocking 4.3.0.3
OMEGA 5.0.0.3
PICTO 5.1.0.3
pKa-Prospector 1.2.2.3
QUACPAC 2.2.3.3
ROCS 3.6.1.3
SiteHopper 2.0.4.3
SPRUCE 1.5.3.3
SZMAP 1.6.7.3
SZYBKI 2.7.0.3
VIDA 5.0.5.3
Glossary
Bibliography

Applications-

All OpenEye Documentation »
Contents »
EON 2.4.2.3 »
Release History »
EON 2.4.2

EON 2.4.2¶

Minor internal improvements have been made.

Zap TK 2.4.6¶

New features¶

New overloads of GetArea have been added that return solvent accessible surface areas for specific residues.

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© Copyright 2024, Cadence Design Systems, Inc. (Cadence). Last updated on Jan 22, 2024.